Chapter 3 Advances in Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy-Reference-Cited by-同舟云学术

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Chapter 3 Advances in Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy

Published:2008 Issue: Volume: Page:121-160
ISSN:1076-5670
Container-title:Advances in Imaging and Electron Physics
language:
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Author:

Krivanek Ondrej L.,Dellby Niklas,Keyse Robert J.,Murfitt Matthew F.,Own Christopher S.,Szilagyi Zoltan S.

Publisher

Elsevier

Reference116 articles.

1. “EELS Atlas.”;Ahn,1983

2. Modeling high-resolution electron microscopy based on core-loss spectroscopy;Allen;Ultramicroscopy,2006

3. Two new simplified systems for the correction of spherical aberration in electron lenses;Archard;Proc. Roy Soc.,1955

4. Characterizing probe performance in the aberration corrected STEM;Batson;Ultramicroscopy,2006

5. Sub-ångstrom resolution using aberration corrected electron optics;Batson;Nature,2002

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