Generation–recombination noise modelling in semiconductor devices through population or approximate equivalent current density fluctuations
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Macroscopic and microscopic methods for noise in devices
2. Fluctuations and noise of hot carriers in semiconductor materials and devices
3. van der Ziel, A., Noise in Solid State Devices and Circuits. Wiley, 1986
4. The transfer-impedance method for noise in field-effect transistors
5. Generation-recombination noise at 77°K in silicon bars and JFETs
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