The enhancement factor and the characterization of amorphous carbon field emitters-Reference-Cited by-同舟云学术

The enhancement factor and the characterization of amorphous carbon field emitters

Published:2001-06 Issue:6 Volume:45 Page:857-863
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Edgcombe C.J,Valdrè U

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Fabrication of Nano-Tips by Carbon Contamination in a Scanning Electron Microscope for Use in Scanning Probe Microscopy and Field Emission

2. Edgcombe CJ, Valdrè U. In: Kirkland A, Brown PD, editors. Proc. Int. Centennial Electron (Cambridge). London: IoM Communications Ltd; 1997. p. 318–25

3. Edgcombe CJ, Valdrè U. Microscopy Microanalysis vol. 6. MSA 99, Howie Symposium, 2000. p. 380–7

4. Transmission electron microscopy;Reimer,1997

5. Field Emission

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