Author:
Romanjek K.,Lime F.,Ghibaudo G.,Leroux C.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. A new analytical delay and noise model for on-chip RLC interconnect;Cao;IEDM Tech. Digest,2000
2. Gate current: modeling, delta L extraction and impact on RF performance;Van-Langevelde;IEDM Tech. Digest,2001
3. A general partition scheme of gate leakage current suitable for MOSFET compact models;Shih;IEDM Tech. Digest,2001
4. Analytical modeling of transfer admittance in small MOSFETs and application to interface state characterisation;Haddara;Sol. State Electron,1988
5. Impact of gate tunneling leakage on the operation of NMOS transistors with ultra-thin gate oxides;Lime;Microelec. Eng.,2001
Cited by
15 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献