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Measuring isolated surface charge with a noncontacting voltmeter

  • Published:1995-08 Issue:2-3 Volume:35 Page:203-213
  • ISSN:0304-3886
  • Container-title:Journal of Electrostatics
  • language:en
  • Short-container-title:Journal of Electrostatics

Author:

Horenstein Mark N.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Biotechnology,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. A Review of Current Electrostatic Measurement Techniques and their Limitations;Vosteen,1984

2. 1975 Annual Rpt., Conf. of Elec. Ins. and Dielec. Phen.;Cunningham,1978

3. 1972 Annual Rpt., Conf. of Elec. Ins. and Dielec. Phen.;Van Roggen,1972

4. Static Electricity: Causes, Analysis, and Prevention;Schmieg,1991

5. Noncontact surface charge density profiles measurement on top and bottom of a charged film

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