Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference25 articles.
1. Phase modulated ellipsometry from the ultraviolet to the infrared: In situ application to the growth of semiconductors
2. R.W. Collins, I. An, V. Nguyen, Y. Li, Y. Lu, in: M.H. Francombe, J.L. Vossen (Eds.), Optical Characterization of Real Surfaces and Films, Academic Press, San Diego, 1994, p. 49.
3. For a review see A.C. Boccara, C. Pickering, J. Rivory (Eds.), Spectroscopic Ellipsometry, Elsevier, Amsterdam, 1993 or Thin Solid Films 233-234 (1993) 704.
4. Calibration improvement of Fourier transform infrared phase-modulated ellipsometry
5. Spectroscopic IR ellipsometry with imperfect components
Cited by
39 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献