Real-Time Spectroscopic Ellipsometry Studies of the Nucleation, Growth, and Optical Functions of Thin Films, Part I: Tetrahedrally Bonded Materials-Reference-Cited by-同舟云学术

Real-Time Spectroscopic Ellipsometry Studies of the Nucleation, Growth, and Optical Functions of Thin Films, Part I: Tetrahedrally Bonded Materials

Published:1994 Issue: Volume: Page:49-125
ISSN:0079-1970
Container-title:Physics of Thin Films
language:
Short-container-title:

Author:

COLLINS ROBERT W.,AN ILSIN,NGUYEN HIEN V.,LI YOUMING,LU YIWEI

Publisher

Elsevier

Reference103 articles.

1. N. M. Bashara, A. B. Buckman, and A. C. Hall, ed., “Proceedings of the Symposium on Recent Developments in Ellipsometry,” North-Holland, Amsterdam, 1969; also published as Surf. Sci. 16 (1969).

2. N. M. Bashara and R. M. A. Azzam, ed., “Ellipsometry: Proceedings of the Third International Conference on Ellipsometry,” North-Holland, Amsterdam, 1976; also published as Surf. Sci. 56 (1976).

3. R. H. Muller, R. M. A. Azzam, and D. E. Aspnes, ed., “Ellipsometry: Proceedings of the Fourth International Conference on Ellipsometry,” North-Holland, Amsterdam, 1980; also published as Surf. Sci. 96 (1980).

4. Ellipsometry and other Optical Methods for Surface and Thin Film Analysis;Abeles,1983

5. “The Proceedings of the First International Conference on Spectroscopic Ellipsometry,” Paris, France, January 1993; also published as Thin Solid Films 233 and 234 (1993).

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