Thermal stability of nonstoichiometric silicon nitride films made by reactive dc magnetron sputter deposition
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. S. Wolf, R.N. Tauber, Silicon Processing for the VLSI Era, Vol. 1, Process Technology, Sunset Beach Lattice Press, CA, USA, 1986.
2. Optical and structural properties of SiOx and SiNx materials
3. Chemical bonds and microstructure in nearly stoichiometric PECVD aSixNyHz
4. Characterization of Reactively Sputtered Silicon Nitride
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