SiC/Si heteroepitaxial growth
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference32 articles.
1. Figure of merit for semiconductors for high-speed switches
2. Power semiconductor device figure of merit for high-frequency applications
3. Comparison of 6H-SiC, 3C-SiC, and Si for power devices
4. Thin film deposition and microelectronic and optoelectronic device fabrication and characterization in monocrystalline alpha and beta silicon carbide
Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Optimizing the chemical vapor deposition process of 4H–SiC epitaxial layer growth with machine-learning-assisted multiphysics simulations;Case Studies in Thermal Engineering;2024-07
2. Optimizing the Chemical Vapor Deposition Process of 4h-Sic Epitaxial Layer Growth with Machine-Learning-Assisted Multiphysics Simulations;2024
3. The origin and nature of killer defects in 3C-SiC for power electronic applications by a multiscale atomistic approach;Journal of Materials Chemistry C;2020
4. Spectroscopic phonon and extended x-ray absorption fine structure measurements on 3C-SiC/Si (001) epifilms;Applied Surface Science;2018-01
5. Structure of domain boundaries: group IV elements and IV–IV compounds: SiC;Physics of Solid Surfaces;2018
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3