Growth and characterization of Pb(Zr,Ti)O3 thin films and ferroelectric polarization charging of YBa2Cu3O7 thin films-Reference-Cited by-同舟云学术

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Growth and characterization of Pb(Zr,Ti)O3 thin films and ferroelectric polarization charging of YBa2Cu3O7 thin films

Published:2001-03 Issue:1 Volume:384 Page:1-14
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Aidam R.,Schneider R.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference56 articles.

1. Handbook of Thin Film Process Technology;Sayer,1995

2. K.-H. Hellwege (Ed.), Landolt-Börnstein Vol. 16(a), Ferroelectrics and Related Substances, Springer-Verlag, Berlin–Heidelberg, 1981, pp. 78, 119.

3. Ferroelectric Memories

4. Growth and characterization of ferroelectric BaMgF4 films

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation on the Current Transport Characteristics of SrTiO3/YBa2Cu3O7−x Heterostructure;Journal of Superconductivity and Novel Magnetism;2017-11-23

2. Effects of Pb(Zr0.52Ti0.48)O3 polarization on the YBa2Cu3O7−x electrical transport and magnetization;Materials Research Express;2017-03-22

3. STRUCTURAL, MICRO STRUCTURAL AND ELECTRICAL PROPERTIES COMPARISON OF PZT FILMS DEPOSITED ON DIFFERENT BOTTOM ELECTRODES;Integrated Ferroelectrics;2006-11

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