STRUCTURAL, MICRO STRUCTURAL AND ELECTRICAL PROPERTIES COMPARISON OF PZT FILMS DEPOSITED ON DIFFERENT BOTTOM ELECTRODES-Reference-Cited by-同舟云学术

STRUCTURAL, MICRO STRUCTURAL AND ELECTRICAL PROPERTIES COMPARISON OF PZT FILMS DEPOSITED ON DIFFERENT BOTTOM ELECTRODES

Published:2006-11 Issue:1 Volume:80 Page:237-243
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

SOYER C.¹,WANG G.¹²,CATTAN E.¹,RÈMIENS D.¹

Affiliation:

1. a IEMN-DOAE-MIMM team, CNRS UMR 8520, Bat. P3, Cité scientifique , Villeneuve d'Ascq, 59655, France

2. b National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences , Yutian Road 500, Shanghai, 200083, People's Republic of China

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580600659357

Reference11 articles.

1. Ferroelectric properties of Pb(Zr, Ti)O3 thin films deposited on annealed IrO2 and Ir bottom electrodes

2. Comparison of epitaxial growth of PbZr0.53Ti0.47O3 on SrRuO3 and La0.5Sr0.5CoO3

3. Growth and characterization of Pb(Zr,Ti)O3 thin films and ferroelectric polarization charging of YBa2Cu3O7 thin films

4. Comparative analysis for the crystalline and ferroelectric properties of Pb(Zr,Ti)O3 thin films deposited on metallic LaNiO3 and Pt electrodes

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