Author:
Coleman P.G.,Edwardson C.J.,Zhang Anbang,Ma Xiangyang,Pi Xiaodong,Yang Deren
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
1 articles.
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1. Testing of defects in Si semiconductor apparatus by using single-photon detection;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-07