Annealing behavior comparison of NTD FZ (H) Si irradiated in light-water-reactor and heavy-water-reactor-Reference-Cited by-同舟云学术

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Annealing behavior comparison of NTD FZ (H) Si irradiated in light-water-reactor and heavy-water-reactor

Published:2004-03 Issue:2 Volume:107 Page:119-123
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Li Huaixiang,Wang Ruihua,Zhang Hua,Zhao Jing,Liu Guirong,Chen Yansheng,Duan Shuzhen

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference12 articles.

1. Positron annihilation investigation of defects in hydrogen containing FZ Si irradiated with high-dose reactor neutrons

2. Hydrogen in crystalline semiconductors

3. Hydrogen in crystalline semiconductors

4. Hydrogen-induced platelets in silicon: Infrared absorption and Raman scattering

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1. Effects of Epithermal Neutron Irradiation on the Characteristics of the Porous Silicon;Silicon;2022-01-15

2. Electrochemical Degradation of Methyl Orange by Samarium and Antimony Codoped SnO₂ Electrodes;Advanced Materials Research;2014-08

3. Effect of Univalent Cations Fluoride in F-Sb Codoped SnO₂ Electrode on Electro-Catalytic Degradation of Methyl Orange;Advanced Materials Research;2012-02

4. Recovery of neutron-induced damage of Si analyzed by thermal expansion measurement;Journal of Nuclear Materials;2009-04

5. The effect of neutron irradiation defects on electrical resistivity in FZ-silicon samples irradiated at Es-Salam research reactor;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-09

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