The effect of annealing treatment on microstructure and properties of indium tin oxides films
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference23 articles.
1. Properties of amorphous tin-doped indium oxide thin films deposited by O2/Ar mixture ion beam-assisted system at room temperature
2. Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy
3. Properties of ITO thin films deposited by RF magnetron sputtering at elevated substrate temperature
4. Effects of Tin Concentrations on Structural Characteristics and Electrooptical Properties of Tin-Doped Indium Oxide Films Prepared by RF Magnetron Sputtering
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