Ion beam dosimetry by Rutherford backscattering with continuous rotation of the sample-Reference-Cited by-同舟云学术

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Ion beam dosimetry by Rutherford backscattering with continuous rotation of the sample

Published:1983-12 Issue:1-3 Volume:218 Page:103-106
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Hemment P.L.F.,Maydell-Ondrusz E.A.,Stephens K.G.

Publisher

Elsevier BV

Subject

General Engineering

Reference12 articles.

1. Dosimetry techniques

2. Four‐Point Sheet Resistance Measurements of Semiconductor Doping Uniformity

3. A gold and aluminium implanted standard for ion beam experiments

4. Standards for backscattering analysis

5. How accurate are absolute rutherford backscattering yields

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis by absorption and scattering of radiation;Journal of Radioanalytical and Nuclear Chemistry Articles;1986-06

2. Low-energy (2-5 keV) argon damage in silicon;Journal of Physics D: Applied Physics;1986-04-14

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