1. Trace Element Accelerator Mass Spectrometry;Characterization of Materials;2012-10-12
2. Mass Spectrometry in Semiconductor Research;Mass Spectrometry Handbook;2012-05-21
3. Trace Element Accelerator Mass Spectrometry;Characterization of Materials;2002-10-15
4. Iron contamination in silicon technology;Applied Physics A: Materials Science & Processing;2000-05-01
5. Trace-element analysis of mineral grains using accelerator mass spectrometry — from sampling to interpretation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-03