Author:
Kilner J.A.,Littlewood S.D.,Hemment P.L.F.,Maydell-Ondrusz E.,Stephens K.G.
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2. E'1 centres in buried oxide layers formed by oxygen ion implantation into silicon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-03
3. The location and annealing of paramagnetic oxygen vacancies (E1' centres) in silicon implanted with high doses of oxygen;Journal of Physics: Condensed Matter;1991-04-01
4. Depth profile analysis of two element mixtures by rutherford backscattering spectrometry;Radiation Effects and Defects in Solids;1990-05
5. Nitrogen-15 isotope tracer studies of buried nitride layer formation by high dose implantation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1989-03