A computational investigation of the effect of three-dimensional void morphology on the thermal resistance of solder thermal interface materials

Author:

Okereke Michael I.,Ling YuxiaoORCID

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Energy Engineering and Power Technology

Reference41 articles.

1. Chip-scale packaging of power devices and its application in integrated power electronics modules;Liu;IEEE Trans. Adv. Packag.,2001

2. Chip Scale Package (CSP): Design, Materials, Processes, Reliability, and Applications. Electronic Packaging and Interconnection Series;Lau,1999

3. Low Voltage Power MOSFETs: Design, Performance and Applications. Springer Briefs in Applied Sciences and Technology;Korec,2011

4. Flip-chip on flex integrated power electronics modules for high-density power integration;Bai;IEEE Trans. Adv. Packag.,2003

5. Effects of voids on mechanical and thermal properties of the die attach solder layer used in high-power led chip-scale packages;Jiang;IEEE Trans. Compon. Packag. Manuf. Technol.,2018

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