Low frequency noise in copper doped germanium infrared detectors caused by thermal impedance fluctuations
Author:
Publisher
Elsevier BV
Subject
General Engineering
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1. Device for measuring doping impurities of Groups III and V in high-purity silicon by long-wavelength spectroscopy;Bulletin of the Russian Academy of Sciences: Physics;2013-12
2. Helium temperature fluctuations in various phases;Journal of Engineering Physics;1977-10
3. REFERENCE LIST AND AUTHOR INDEX;Semiconductor Opto-Electronics;1973
4. Low frequency temperature fluctuations of liquid helium in cryostats;Cryogenics;1971-04
5. Infrared Spectroscopy at Sub-Ambient Temperatures: I. Literature Review;Applied Spectroscopy;1969-09
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