Semiconductor assessment using photothermal radiometry-Reference-Cited by-同舟云学术

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Semiconductor assessment using photothermal radiometry

Published:1988-09 Issue:5 Volume:28 Page:287-292
ISSN:0020-0891
Container-title:Infrared Physics
language:en
Short-container-title:Infrared Physics

Author:

Sheard S.J.,Somekh M.G.

Publisher

Elsevier BV

Subject

General Engineering

Reference16 articles.

1. The electrical characterisation of semiconductors

2. Imaging with Optically Generated Thermal Waves

3. Theory of the photoacoustic effect with solids

4. Scanned Image Microscopy;Fournier,1981

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Applicability of photothermal radiometry for temperature measurement of semiconductors;International Journal of Heat and Mass Transfer;1998-08

2. Photothermal radiometric and spectroscopic measurements on silicon nitride thin films;Journal of Applied Physics;1997-12-15

3. Detection of Silicon Wafer Contamination by Lifetime Measurement Using Infrared Photothermal Radiometry;physica status solidi (a);1997-09

4. Photon effect on radiative properties of silicon during rapid thermal processing;Journal of Applied Physics;1997-07-15

5. Non‐contacting measurements of photocarrier lifetimes in bulk‐ and polycrystalline thin‐film Si photoconductive devices by photothermal radiometry;Journal of Applied Physics;1996-11

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