Microstructure and electrical properties of PbZr0.48Ti0.52O3 ferroelectric films on different Pt bottom electrodes
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference13 articles.
1. Ferroelectric Memories
2. Grain morphology and cation composition heterogeneity of Pb(ZrxTi1–x)O3 thin films deposited by metal-organic chemical vapor deposition
3. Microstructures and interdiffusions of Pt/Ti electrodes with respect to annealing in the oxygen ambient
4. Investigation of Pt/Ti bilayer metallization on silicon for ferroelectric thin film integration
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1. Ferroelectric random access memory with high electric properties and high production yield realized by employing an AlOx underlying layer of Pt bottom electrode for a La-doped lead zirconate titanate capacitor;Japanese Journal of Applied Physics;2018-11-19
2. Effect of microstructure on irradiated ferroelectric thin films;Journal of Applied Physics;2017-06-28
3. INVESTIGATION OF LEAKAGE CURRENT BEHAVIOR OF Pt/Bi0.975La0.025Fe0.975Ni0.025O3/Pt CAPACITOR MEASURED AT DIFFERENT TEMPERATURES;Surface Review and Letters;2014-04
4. COMBINATORIAL PREPARATION AND FERROELECTRIC PROPERTIES OF COMPOSITIONALLY GRADIENT PZT THIN FILMS;Functional Materials Letters;2013-05-28
5. Properties of Pb(Zr0.52Ti0.48)O3, SrBi2Ta2O9, and Nd2Ti2O7in a MFIS of Y2O3Insulator Base Structure for Fe FET;Ferroelectrics;2011-01
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