Dynamic force microscopy with atomic resolution at low temperatures-Reference-Cited by-同舟云学术

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Dynamic force microscopy with atomic resolution at low temperatures

Published:2002-03 Issue:3-4 Volume:188 Page:245-251
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Schwarz Alexander,Schwarz Udo D.,Langkat Shenja,Hölscher Hendrik,Allers Wolf,Wiesendanger Roland

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference44 articles.

1. Atomic Force Microscope

2. True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces

3. A low-temperature atomic force/scanning tunneling microscope for ultrahigh vacuum

4. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

5. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity

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1. Simultaneous Deconvolution of In‐Plane and Out‐of‐Plane Forces of HOPG at the Atomic Scale under Ambient Conditions by Multifrequency Atomic Force Microscopy;Advanced Materials Interfaces;2021-09-29

2. Chemical identification with non-contact atomic force microscopy of xenon atoms adsorbed on graphene on Pt(111) surfaces;Applied Surface Science;2021-03

3. Xenon on Graphene/Pt(111) at Low Temperature: Influence of the Metal Support;The Journal of Physical Chemistry C;2020-10-27

4. Understanding interferometry for micro-cantilever displacement detection;Beilstein Journal of Nanotechnology;2016-06-10

5. Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces;Surface Science Tools for Nanomaterials Characterization;2015

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