Prospects for imaging TOF-SIMS: from fundamentals to biotechnology

Author:

Winograd N.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference22 articles.

1. J.C. Vickerman, D. Briggs (Eds.), ToFSIMS: Surface Analysis by Mass Spectrometry, 2001, in press.

2. Mechanistic study of atomic desorption resulting from the keV-ion bombardment of fcc{001} single-crystal metals

3. Coverage-Dependent Molecular Ejection from Ion-Bombarded C6H6/Ag{111}

4. C. Meserole, E. Vanderweert, Z. Postawa, B.J. Garrison, N. Winograd, in preparation.

5. Collision cascade and sputtering process in a polymer;Delcorte;J. Phys. Chem. B,2001

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