Competing failure modes in accelerated life testing

Author:

Bunea C.,Mazzuchi T.A.

Publisher

Elsevier BV

Subject

Applied Mathematics,Statistics, Probability and Uncertainty,Statistics and Probability

Reference14 articles.

1. Mathematical Models for Reliability Data;Bunea,2003

2. Bunea, C., Charitos, T., Cooke, R.M., Becker, G., 2003. Two-stage Bayesian models—application to ZEDB project, ESREL 2003 Conference, June 15–18, Maastricht, The Netherlands. In: Bedford, T.J., Van Gelder, P. (Eds.), Safety and Reliability, vol. 1. Balkema, Lisse, pp. 321–329.

3. Classical Competing Risks;Crowder,2001

4. Bayesian estimation and optimal design in partially accelerated life testing;DeGroot;Naval Res. Logistics Quarterly,1979

5. Analysis of competing risks by using Bayesian smoothing;Gasbarra;Scandinavian J. Statist.,2000

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