Beam profile analysis for a 252Cf plasma-desorption time-of-flight mass spectrometer
Author:
Publisher
Elsevier BV
Subject
Spectroscopy
Reference7 articles.
1. 252Cf-plasma desorption time-of-flight mass spectrometry
2. Thin film deposition by the electrospray method for californium-252 plasma desorption studies of involatile molecules
3. Experimental Investigation about the Mechanism of Fission-Fragment Induced Desorption
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Low-mass secondary-ion ejection from molecular solids by MeV heavy ions: Radial velocity distributions;Physical Review B;1996-08-01
2. MeV ion sputtering of polymers: correlation between secondary ion radial velocity distributions and heavy ion track structure;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-06
3. Particle-Induced Desorption Ionization Techniques for Organic Mass Spectrometry;Ion Spectroscopies for Surface Analysis;1991
4. RADIAL VELOCITY MEASUREMENTS OF SECONDARY MOLECULAR IONS IN keV AND MeV BOMBARDMENT;Le Journal de Physique Colloques;1989-02
5. A secondary ion time-of-flight mass spectrometer with an ion mirror;International Journal of Mass Spectrometry and Ion Processes;1988-07
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