Design of a combined ion and electron microprobe apparatus-Reference-Cited by-同舟云学术

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Design of a combined ion and electron microprobe apparatus

Published:1971-06 Issue:5-6 Volume:6 Page:401-412
ISSN:0020-7381
Container-title:International Journal of Mass Spectrometry and Ion Physics
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Physics

Author:

Liebl Helmut

Publisher

Elsevier BV

Subject

Spectroscopy

Reference53 articles.

1. Zur Energieverteilung der an einer Oberfl�che durch Ionenbeschu� ausgel�sten H?-Ionen

Cited by 41 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. SIMS characterization of HgCdTe and related II-VI compounds;Journal of Electronic Materials;1996-08

2. Time focusing magnetic wedge-field sectors for time-resolved ion momentum spectrometry;Rapid Communications in Mass Spectrometry;1995

3. Secondary Ion Mass Spectrometry Imaging;Applied Spectroscopy Reviews;1994-02

4. Comparison of basic principles of the surface-specific analytical methods: AES/SAM, ESCA (XPS), SIMS, and ISS with X-ray microanalysis, and some applications in research and industry;Scanning;1989

5. Mass analyzed secondary ion microscopy;Review of Scientific Instruments;1987-10

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