Comparison of basic principles of the surface-specific analytical methods: AES/SAM, ESCA (XPS), SIMS, and ISS with X-ray microanalysis, and some applications in research and industry-Reference-Cited by-同舟云学术

Comparison of basic principles of the surface-specific analytical methods: AES/SAM, ESCA (XPS), SIMS, and ISS with X-ray microanalysis, and some applications in research and industry

Published:1989 Issue:6 Volume:11 Page:257-280
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Hantsche H.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.4950110602/fullpdf

Reference151 articles.

1. Seah MP

2. Abbreviation for microscopical and analytical methods;Hantsche;Microscopica Acta,1983

3. Alpha‐, Beta‐, and Gamma‐Ray Spectroscopy

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