Detector discrimination in sims II. Ion-to-electron converter yield factors for negative ions
Author:
Publisher
Elsevier BV
Subject
Spectroscopy
Reference8 articles.
1. Detector discrimination in SIMS: Ion-to-electron converter yield factors for positive ions
2. Emission $eacute$lectronique secondaire d'une cible de molybd$egrave$ne bombard$eacute$e par des ions positifs et n$eacute$gatifs d'un m$ecirc$me $eacute$l$eacute$ment
3. Investigation of the decelerating field of an electron multiplier under negative ion impact
4. Electron multiplier operation for negative ions
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1. Statistical description of metastable negative ions’ decay;International Journal of Mass Spectrometry;2008-06
2. Inverse velocities of sputtered monatomic ions: Systematics and quantification;Microchimica Acta;1997-03
3. The infinite velocity method: A new method for SIMS quantification;Surface and Interface Analysis;1994-11
4. Construction and operation of an ultrahigh vacuum chemical vapor deposition epitaxial reactor for growth of GexSi1−x;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1990-05
5. Characterization of Electron Multipliers by Charge Distributions;Springer Series in Chemical Physics;1986
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