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2. and Secondary Ion Mass Spectrometry; Basic Concepts, Instrumental Aspects, Applications and Trends. Wiley, New York (1987).
3. and Secondary Ion Mass Spectrometry; A Practical Handbook for Depth Profiling and Bulk Impurity Analysis. Wiley, New York (1989).
4. Velocity dependence of secondary-ion emission
5. Ionization probability of sputtered atoms