1. A novel hci reliability model for rf/mmwave applications in fdsoi technology;Arfaoui,2020
2. Reliability efects on MOS transistors due to hot-carrier injection;Chen;IEEE Transactions on Electron Devices,1985
3. Curtis, G. et al. (2021). Aging analysis common model interface gains momentum. https://semiengineering.com/aging-analysis-common-model-interface-gains-momentum/. Accessed: 20.10.2021.
4. Process Variations and Probabilistic Integrated Circuit Design;Dietrich,2012
5. NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level Modeling;Giering;IEEE Transactions on Electron Devices,2019