Author:
Lavrentyev Anton I.,Rokhlin Stanislav I.
Subject
Acoustics and Ultrasonics
Reference21 articles.
1. S.I. Rokhlin, A.I. Lavrentyev, Ultrasonic characterization of thin surface and interphase layers, in: G. Birnbaum, B.A. Auld (Eds.), Nondestructive Sensing: Manufacturing and Characterization of Materials and Parts, ASNT, 1999
2. Cut-off characteristics of leaky sezawa and pseudo-sezawa wave modes for thin-film characterization;Kushibiki;Appl. Phys. Lett.,1990
3. Line-focus acoustic microscopy measurements of Nb2O5/MgO and BaTiO3/LaAlO3 thin-film/substrate configurations;Lee;IEEE Trans. Ultras. Ferroelectr. Frequency Ctrl.,1995
4. J.D. Achenbach, J.O. Kim, Y.-C. Lee, Measuring thin-film elastic constants by line-focus acoustic microscopy, in: Andrew Briggs (Ed.), Advances in Acoustic Microscopy, vol. 1, Plenum Press, New York, 1995, pp. 153–208
5. R.C. Addison, M. Somekh, G.A.D. Briggs, Techniques for characterization of film adhesion, IEEE Symposium, 1986, pp. 775–782
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