Line-focus acoustic microscopy measurements of Nb/sub 2/O/sub 5//MgO and BaTiO/sub 3//LaAlO/sub 3/ thin-film/substrate configurations-Reference-Cited by-同舟云学术

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Line-focus acoustic microscopy measurements of Nb/sub 2/O/sub 5//MgO and BaTiO/sub 3//LaAlO/sub 3/ thin-film/substrate configurations

Published:1995-05 Issue:3 Volume:42 Page:376-380
ISSN:0885-3010
Container-title:IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
language:
Short-container-title:IEEE Trans. Ultrason., Ferroelect., Freq. Contr.

Author:

Lee Y.-C.,Achenbach J.D.,Nystrom M.J.,Gilbert S.R.,Block B.A.,Wessels B.W.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Acoustics and Ultrasonics,Instrumentation

Link

http://xplorestaging.ieee.org/ielx1/58/8722/00384445.pdf?arnumber=384445

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2. Adhesion Evaluation of PMMA/Silicon Film Structures;Acta Acustica united with Acustica;2017-11-01

3. An Improved Weighting Method for Inversely Determining Elastic Constants of Coating Layers from Dispersion Curves of Surface Acoustic Waves;Experimental Mechanics;2013-03-20

4. Nondestructive Determination of Elastic Constants of Thin Isotropic Plates Based on Poly(vinylidene fluoride–trifluoroethylene) Copolymer Ultrasound Focusing Transducers and Lamb Wave Measurements;Japanese Journal of Applied Physics;2009-04-20

5. Microacoustic evaluation of elastic parameters of highly porous silicon layers;Semiconductor physics, quantum electronics and optoelectronics;2006-10-31

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