Rotating Polarizer and Analyzer ElliPsometry-Reference-Cited by-同舟云学术

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Rotating Polarizer and Analyzer ElliPsometry

Published:2005 Issue: Volume: Page:329-432
ISSN:
Container-title:Handbook of Ellipsometry
language:
Short-container-title:

Author:

Collins Robert W.,An Ilsin,Chen Chi

Publisher

Elsevier

Reference89 articles.

1. Ellipsometry and Polarized Light;Azzam,1977

2. A User's Guide to Ellipsometry;Tompkins,1992

3. Ellipsometry in the Measurement of Surfaces and Thin Films,1964

4. Proceedings of the Symposium on Recent Developments in Ellipsometry,1969

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On-line Monitoring of Photovoltaics Production;Spectroscopic Ellipsometry for Photovoltaics;2018

2. Optical Simulation of External Quantum Efficiency Spectra;Spectroscopic Ellipsometry for Photovoltaics;2018

3. Optical models for ultrathin oxides on Si- and C-terminated faces of thermally oxidized SiC;Journal of Applied Physics;2009-12-15

4. Electronic and structural properties of molybdenum thin films as determined by real-time spectroscopic ellipsometry;Applied Physics Letters;2009-04-06

5. Nanocrystal characterization by ellipsometry in porous silicon using model dielectric function;Journal of Applied Physics;2009-01-15

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