A novel STM-based depth profiling technique for the electronic characterisation of thin film materials-Reference-Cited by-同舟云学术

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A novel STM-based depth profiling technique for the electronic characterisation of thin film materials

Published:2000-08 Issue: Volume:162-163 Page:630-637
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Fan Y.,Fitzgerald A.G.,Cairns J.A.,John P.,Troupe C.E.,Wilson J.I.B.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference21 articles.

1. Scanning Probe Microscopy and Spectroscopy: Methods and Applications,1994

2. Application of scanning probe methods for electronic and magnetic device fabrication, characterization, and testing

3. Scanning probe microscopy of high-temperature superconductors

4. Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis;Magonov,1996

5. Cross‐sectional imaging and spectroscopy of GaAs doping superlattices by scanning tunneling microscopy

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1. Measurement of local thickness of oxide layer and its electronic characteristics by scanning tunneling microscopy;Nanotechnologies in Russia;2013-09

2. Electrical transconduction through organic layers Si–C bonded to silicon substrates;Microelectronic Engineering;2003-09

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