Application of scanning probe methods for electronic and magnetic device fabrication, characterization, and testing-Reference-Cited by-同舟云学术

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Application of scanning probe methods for electronic and magnetic device fabrication, characterization, and testing

Published:1996-11 Issue:6 Volume:14 Page:3625
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:
Short-container-title:J. Vac. Sci. Technol. B

Author:

Born A.

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ordered magnetic nanostructures: fabrication and properties;Journal of Magnetism and Magnetic Materials;2003-01

2. A novel STM-based depth profiling technique for the electronic characterisation of thin film materials;Applied Surface Science;2000-08

3. Nanoscale surface modification and nanostructural fabrication of YBa[sub 2]Cu[sub 3]O[sub 7−x] thin films by scanning tunneling microscopy;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2000

4. TWO-DIMENSIONAL DOPANT PROFILING BY SCANNING CAPACITANCE MICROSCOPY;Annual Review of Materials Science;1999-08

5. Present and future developments of SPM systems as mass storage devices;Applied Physics A: Materials Science & Processing;1999-02-01

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