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Investigation of the atomic crystal plane relief by X-ray epitaxial film interferometer

  • Published:2000-10 Issue:1-4 Volume:166 Page:82-86
  • ISSN:0169-4332
  • Container-title:Applied Surface Science
  • language:en
  • Short-container-title:Applied Surface Science

Author:

Kolesnikov A.V.,Vasilenko A.P.,Trukhanov E.M.,Sokolov L.V.,Fedorov A.A.,Pchelyakov O.P.,Romanov S.I.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

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1. X-Ray Diffraction Topography Methods (Review);Physics of the Solid State;2021-02

2. РЕНТГЕНОВСКАЯ ДИФРАКЦИОННАЯ ТОПОГРАФИЯ (ОБЗОР);2020-05-22

3. X-ray diffraction topography for materials science;Crystallography Reports;2012-09

4. X-ray interference topography investigation of Si/GexSi1 x/Si(001) heterosystem;Journal of Physics D: Applied Physics;2003-04-22

5. X-ray film interferometer as an instrument for semiconductor heterostructure investigation;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2001-09
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