Author:
Nakamura S,Watanabe D,En A,Suhara M,Okumura T
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference9 articles.
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2. Contactless Method for Electrical Characterization of Silicon-on-Insulator Materials
3. Contactless characterization of surface and interface band-bending in Silicon-On-Insulator (SOI) structures
4. D. Watanabe, A. En, S. Nakamura, M. Suhara, T. Okumura, Appl. Surf. Sci., submitted for publication.
5. V. Contact electricity of metals
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