1. Digital Systems Testing and Testable Design;Abramovici,1990
2. On low power BIST for carry save array multipliers;Bakalis,1999
3. Low power dissipation in BIST schemes for modified Booth multipliers;Bakalis,1999
4. D. Bakalis, E. Kalligeros, D. Nikolos, H.T. Vergos, G. Alexiou, Low power BIST for Wallace tree-based fast multipliers, Computer Technology Institute Technical Report (TR99/09/07), Patras, Greece, 1999
5. Techniques for minimizing power dissipation in scan and combinational circuits during test application;Dabholkar;IEEE Transactions on CAD of Integrated Circuits and Systems,1998