Mapping of CdZnTe substrates and CdHgTe epitaxial layers by X-ray diffraction-Reference-Cited by-同舟云学术

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Mapping of CdZnTe substrates and CdHgTe epitaxial layers by X-ray diffraction

Published:1997-02 Issue:1-2 Volume:172 Page:97-105
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Skauli T.,Colin T.,Løvold S.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference15 articles.

1. Properties of Narrow Gap Cadmium-based Compounds;Capper,1994

2. Properties of Narrow Gap Cadmium-based Compounds;Williams,1994

3. Applications of multiple-crystal diffractometry

4. Properties of Narrow Gap Cadmium-based Compounds;Franzosi,1994

5. Precision lattice constant determination

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Full-Wafer Strain and Relaxation Mapping of Hg1−xCdxTe Multilayer Structures Grown on Cd1−yZnyTe Substrates;Journal of Electronic Materials;2019-05-23

2. One-dimensional defect distribution along needle-shaped PrVO4 single crystals grown by the slow-cooling method;Radiation Physics and Chemistry;2013-12

3. Critical Thickness of Exponentially and Linearly Graded HgCdTe/CdZnTe;Journal of Electronic Materials;2009-04-24

4. Annealing study of hydrothermally grown ZnO wafers;Physica Scripta;2006-08-17

5. Investigation of HgTe-HgCdTe superlattices by high-resolution X-ray diffraction;Journal of Electronic Materials;2006-06

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