In-situ determination of interface roughness in MOVPE-grown visible VCSELs by reflectance spectroscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference17 articles.
1. Design, fabrication, and performance of infrared and visible vertical-cavity surface-emitting lasers
2. High efficiency AlGaInP-based 650 nm vertical-cavity surface-emitting lasers
3. Uniparabolic mirror grading for vertical cavity surface emitting lasers
4. In situ pre-growth calibration using reflectance as a control strategy for MOCVD fabrication of device structures
5. MOVPE process development for 650nm VCSELS using optical in-situ techniques
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