Defects and their charge imaging on semiconductor surfaces by noncontact atomic force microscopy and spectroscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference12 articles.
1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
2. Observation of $\bf 7\times 7$ Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
3. Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope
4. Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy
5. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
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