Artifact-free coordinate registration of heterogeneous Large-Scale Metrology systems-Reference-Cited by-同舟云学术

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Artifact-free coordinate registration of heterogeneous Large-Scale Metrology systems

Published:2019 Issue:1 Volume:68 Page:503-506
ISSN:0007-8506
Container-title:CIRP Annals
language:en
Short-container-title:CIRP Annals

Author:

Pfeifer Tilo,Montavon Benjamin,Peterek Martin,Hughes Ben

Funder

LaVA

European Union’s Horizon

EMPIR Participating States

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference18 articles.

1. A New Paradigm in Large-Scale Assembly — Research Priorities in Measurement Assisted Assembly;Maropoulos;The International Journal of Advanced Manufacturing Technology,2014

2. Advances in Large-Scale Metrology — Review and Future Trends;Schmitt;CIRP Annals,2016

3. Cooperative Fusion of Distributed Multi-Sensor LVM (Large Volume Metrology) Systems;Galetto;CIRP Annals,2015

4. Large-scale Dimensional Metrology (LSDM): From Tapes and Theodolites to Multi-Sensor Systems;Franceschini;International Journal of Precision Engineering and Manufacturing,2014

5. A Novel Multi-Target Modular Probe for Multiple Large-Volume Metrology Systems;Maisano;Precision Engineering,2018

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analyses of Key Variables to Industrialize a Multi-Camera System to Guide Robotic Arms;Robotics;2023-01-09

2. Methodology to Evaluate the Performance of Portable Photogrammetry for Large-Volume Metrology;Metrology;2022-06-28

3. Determining the extrinsic parameters of a network of Large-Volume Metrology sensors of different types;Precision Engineering;2022-03

4. New European Metrology Network for advanced manufacturing;Measurement Science and Technology;2021-07-21

5. Holarchy for line-less mobile assembly systems operation in the context of the internet of production;Procedia CIRP;2021

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