Author:
Franceschini Fiorenzo,Galetto Maurizio,Maisano Domenico,Mastrogiacomo Luca
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Mechanical Engineering
Reference154 articles.
1. Purttock, M. J., “Large-Scale Metrology,” CIRP Annals, Vol. 21, No. 2, pp. 351–356 1978.
2. Swyt, D. A., “Length and Dimensional Measurements at NIST,” Journal of Research-National Institute of Standards and Technology, Vol. 106, No. 1, pp. 1–24, 2001.
3. Estler, W. T., Edmundson, K. L., Peggs, G. N., and Parker, D. H., “Large-Scale Metrology-an Update,” CIRP Annals-Manufacturing Technology, Vol. 51, No. 2, pp. 587–609, 2002.
4. Weckenmann, A., Estler, T., Peggs, G., and McMurtry, D., “Probing Systems in Dimensional Metrology,” CIRP Annals-Manufacturing Technology, Vol. 53, No. 2, pp. 657–684, 2004.
5. Hughes, B., “Large Scale Metrology at NPL,” Proc. of the Large Scale Metrology Workshop, 2006.
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