Temperature dependent current–voltage characteristics of Ag/Zn2GeO4/Si diode grown by thermal evaporation method

Author:

Amin Nasir,Mahmood K.ORCID,Ali A.,Ikram Salma,Ashfaq A.,U.Rehman ,Hussain Siyal Sajid

Funder

Pakistan Science Foundation

Publisher

Elsevier BV

Subject

General Medicine

Reference21 articles.

1. Investigation of inhomogeneous barrier height for Au/n-type 6H-SiC Schottky diodes in a wide temperature range;Tamer;Superlattices Microstruct.,2018

2. Comparative study of temperature dependent barrier heights of Pd/ZnO Schottky diodes grown along Zn- and O-faces;Asghar;Key Eng. Mater.,2012

3. Growth and interface properties of Au Schottky contact on ZnO grown by molecular beam epitaxy;Asghar;J. Phys. Conf. Ser.,2013

4. Electrical characterization of Au/ZnO/Si Schottky diodes;Asghar;J. Phys. Conf. Ser.,2013

5. Current-voltage and capacitance-voltage characteristics of Pd Schottky diodes fabricated on ZnO grown along Zn- and O-faces;Malik;Appl. Mech. Mater.,2013

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