Phase-singularities in 2D diffraction fields and interference microscopy-Reference-Cited by-同舟云学术

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Phase-singularities in 2D diffraction fields and interference microscopy

Published:1997-06 Issue:4-6 Volume:138 Page:365-382
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Totzeck M.,Tiziani H.J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. V Phase-Measurement Interferometry Techniques

2. IV Advanced Evaluation Techniques in Interferometry

3. Singularities in Waves and Rays, Course 7;Berry,1981

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