Optical characterization of multi-layer thin films using the surface plasmon resonance method: A six-phase model based on the Kretschmann formalism-Reference-Cited by-同舟云学术

Optical characterization of multi-layer thin films using the surface plasmon resonance method: A six-phase model based on the Kretschmann formalism

Published:2001-12 Issue:1-6 Volume:200 Page:119-130
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Roy D.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference50 articles.

1. INTERFACES AND THIN FILMS AS SEEN BY BOUND ELECTROMAGNETIC WAVES

2. Surface Plasmon Resonance Imaging Measurements of Ultrathin Organic Films

3. Surface plasmon resonance sensors: review

4. Surface plasmon resonance spectroscopy as a tool for investigating the biochemical and biophysical properties of membrane protein systems. I: Theoretical principles

5. Imaging surface plasmon resonance sensor based on multiple wavelengths: Sensitivity considerations

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