Investigation of deep defects and their effects on the properties of NiO/β-Ga2O3 heterojuncion diodes
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Published:2023-06
Issue:
Volume:4
Page:100042
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ISSN:2772-9494
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Container-title:Materials Today Electronics
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language:en
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Short-container-title:Materials Today Electronics
Author:
Almalki AbdulazizORCID, Madani LabedORCID, Sengouga NouredineORCID, Alhassan Sultan, Alotaibi Saud, Alhassni Amra, Almunyif Amjad, Chauhan Jasbinder S., Henini MohamedORCID, Galeti Helder Vinicius AvançoORCID, Gobato Yara Galvão, de Godoy Marcio Peron Franco, Andrade Marcelo B.ORCID, Souto SérgioORCID, Zhou Hong, Wang Boyan, Xiao Ming, Qin YuanORCID, Zhang Yuhao
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