Ion-gating analysis on conduction mechanisms in oxide semiconductors
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Published:2022-10
Issue:
Volume:2
Page:100010
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ISSN:2772-9494
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Container-title:Materials Today Electronics
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language:en
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Short-container-title:Materials Today Electronics
Author:
Lee Won Hyung,
Yang YoungJun,
Park Junwoo,
Yoon Sun Geun,
Jin Huding,
Lee Donggun,
Han Junghyup,
Cho Yong Hyun,
Kim Youn SangORCID
Cited by
4 articles.
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