Convergent-beam electron diffraction from GaAs/AlAs superlattices
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Some aspects of the X-ray structural characterization of (Ga1−xAlxAs)n1(GaAs)n2/GaAs(001) superlattices
2. Modulated Structure Materials;Dohler,1984
3. INtroduction to Analytical Electron Microscopy;Steeds,1979
4. The symmetry of electron diffraction zone axis patterns
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1. Dynamical LACBED analysis of Si/SiGe and Si/SiB multilayer structures;Ultramicroscopy;1993-01
2. On the investigation of local interface sharpness and period uniformity of multilayers in plan-view observation by CBED;Applied Surface Science;1992-01
3. Convergent-beam electron diffraction study of modulations in semiconductor superlattices;Ultramicroscopy;1991-11
4. Fine details in satellite HOLZ reflection discs of CBED from a GaAs/AlAs multilayer;Ultramicroscopy;1991-06
5. Principles and applications of convergent beam electron diffraction: A bibliography (1938-1990);Journal of Electron Microscopy Technique;1991-01
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