Coherent interference effects in SIEM and CBED-Reference-Cited by-同舟云学术

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Coherent interference effects in SIEM and CBED

Published:1981-01 Issue:1 Volume:7 Page:19-26
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Cowley J.M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. J.M. Cowley, in: Scanning Electron Microscopy/1980, Vol. 1, Ed. O. Johari (Scanning Electron Microscopy, AMF O'Hare, IL) p. 61.

2. Innovative imaging and microdiffraction in stem

3. Coherent interference in convergent-beam electron diffraction and shadow imaging

4. Forty Years of History of a Grating Interferometer

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